Published 1990
| Version v1
Book
Beam-solid interactions, physical phenomena
Creators
- 1. Sandia National Laboratories, Albuquerque, NM (USA)
- 2. Cornell Univ., Ithaca, NY (USA)
- 3. Oak Ridge National Lab., Oak Ridge, TN (USA)
Description
This volume contains papers presented at the symposium on beam-solid interactions: physical phenomena. This symposium was devoted to both fundamental and applied research on ion, laser, and electron beam modification and deposition of materials, with particular emphasis on the physical aspects of these interactions. Areas covered include ion-assisted deposition, ion-induced growth, buried layers, ion beam mixing, numerical modeling, novel analysis techniques, fast transient processing, and separate sessions on the beam modification of ceramics, semiconductors, and metals
Availability note (English)
Materials Research Society, 9800 McKnight Rd., Suite 327, Pittsburgh, PA 15237 (USA).Additional details
Additional titles
- Subtitle (English)
- Materials research society symposium proceedings. Volume 157
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 1-55899-045-3
- Imprint Pagination
- 872 p.
Conference
- Title
- physical phenomena.
- Acronym
- Conference on beam-solid interactions
- Dates
- 27 Nov - 2 Dec 1989.
- Place
- Boston, MA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22061671
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; BACKSCATTERING; BEAM-PLASMA SYSTEMS; ELECTRONIC STRUCTURE; FABRICATION; HYDROGEN IONS; IMPURITIES; INTERNATIONAL COOPERATION; ION BEAMS; MEETINGS; MICROSTRUCTURE; OXYGEN IONS; SILICON; SOLID-STATE PLASMA; SPUTTERING; THIN FILMS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COOPERATION; CRYSTAL STRUCTURE; ELEMENTS; FILMS; IONS; PLASMA; SCATTERING; SEMIMETALS
Optional Information
- Secondary number(s)
- CONF-8911139--.