Published April 2011 | Version v1
Journal article

Effect of nitrogen content on electronic structure and properties of SiBCN materials

  • 1. Department of Physics, University of West Bohemia, Univerzitni 22, 30614 Plzen (Czech Republic)

Description

Amorphous SiBCN materials were prepared using reactive magnetron sputtering, and their structure, electronic structure and electrical and optical properties were studied using a combined approach of experiment and ab initio calculations. We focus on the effect of N content over a wide range on the material properties. We find that decreasing the N content (from 54 to 0 at.%) decreases the electrical resistivity (from >108 to 0.2 Ω m) and the optical gap (from 3.5 eV to almost 0), and explain the effect in terms of the band gap and the localization of electronic states. The results allow one to tailor SiBCN compositions which can combine different functional properties, such as high thermal stability and electrical conductivity.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2010.12.030

Additional details

Identifiers

DOI
10.1016/j.actamat.2010.12.030;
PII
S1359-6454(10)00862-1;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
59
Journal Issue
6
Journal Page Range
p. 2341-2349
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43042464
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BONDING; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; MAGNETRONS; MATERIALS; NITROGEN; OPTICAL PROPERTIES; SPUTTERING; STABILITY
Descriptors DEC
ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FABRICATION; JOINING; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.