Published April 2011
| Version v1
Journal article
Effect of nitrogen content on electronic structure and properties of SiBCN materials
Creators
- 1. Department of Physics, University of West Bohemia, Univerzitni 22, 30614 Plzen (Czech Republic)
Description
Amorphous SiBCN materials were prepared using reactive magnetron sputtering, and their structure, electronic structure and electrical and optical properties were studied using a combined approach of experiment and ab initio calculations. We focus on the effect of N content over a wide range on the material properties. We find that decreasing the N content (from 54 to 0 at.%) decreases the electrical resistivity (from >108 to 0.2 Ω m) and the optical gap (from 3.5 eV to almost 0), and explain the effect in terms of the band gap and the localization of electronic states. The results allow one to tailor SiBCN compositions which can combine different functional properties, such as high thermal stability and electrical conductivity.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2010.12.030Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2010.12.030;
- PII
- S1359-6454(10)00862-1;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 59
- Journal Issue
- 6
- Journal Page Range
- p. 2341-2349
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43042464
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BONDING; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; MAGNETRONS; MATERIALS; NITROGEN; OPTICAL PROPERTIES; SPUTTERING; STABILITY
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FABRICATION; JOINING; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.