Published August 1, 1990 | Version v1
Journal article

Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system

  • 1. Oak Ridge National Lab., TN (USA). Solid State Div.

Description

A series of experiments have been undertaken on the Oak Ridge National Laboratory (ORNL) 10 m small-angle X-ray scattering (SAXS) camera to provide quantitative data on the level of background (parasitic) scattering generated by different types of bevelled collimating slits. The addition of a third (guard) slit, positioned close to the sample, resulted in a reduction of over an order of magnitude in the parasitic background generated by the best two-slit combination of collimating slits. This made it possible to reduce the size of the beamstop, permitting useful data to be collected down to a value of the scattering vector Q=4πλ-1sinθ≅3x10-3 A-1, where λ is the wavelength, and 2θ is the angle of scatter. This permitts the resolution of distances d∝2π/Q up to 2000 A. (orig.)

Additional details

Publishing Information

Journal Title
Journal of Applied Crystallography
Journal Volume
23
Journal Issue
4
Series
J. Appl. Crystallogr.
Journal Page Range
241-245
ISSN
0021-8898
CODEN
JACGA

Optional Information

Contract/Grant/Project number
Contract DE-AC05-84OR21400