Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system
Creators
- 1. Oak Ridge National Lab., TN (USA). Solid State Div.
Description
A series of experiments have been undertaken on the Oak Ridge National Laboratory (ORNL) 10 m small-angle X-ray scattering (SAXS) camera to provide quantitative data on the level of background (parasitic) scattering generated by different types of bevelled collimating slits. The addition of a third (guard) slit, positioned close to the sample, resulted in a reduction of over an order of magnitude in the parasitic background generated by the best two-slit combination of collimating slits. This made it possible to reduce the size of the beamstop, permitting useful data to be collected down to a value of the scattering vector Q=4πλ-1sinθ≅3x10-3 A-1, where λ is the wavelength, and 2θ is the angle of scatter. This permitts the resolution of distances d∝2π/Q up to 2000 A. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Applied Crystallography
- Journal Volume
- 23
- Journal Issue
- 4
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 241-245
- ISSN
- 0021-8898
- CODEN
- JACGA
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 22020328
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CAMERAS; COLLIMATORS; ERRORS; SIGNAL-TO-NOISE RATIO; SMALL ANGLE SCATTERING; X RADIATION; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SCATTERING; SPECTRA; SPECTROSCOPY
Optional Information
- Contract/Grant/Project number
- Contract DE-AC05-84OR21400