Simulation of deposition of ink molecules on rough substrates in dip-pen nanolithography
Creators
- 1. Department of Mechanical Engineering, National Kaohsiung University of Applied Sciences, Kaohsiung 817, Taiwan (China)
Description
The pattern transfer mechanism of an alkanethiol self-assembled monolayer (SAM) on various rough surfaces during the dip-pen nanolithography (DPN) process and pattern characterizations are studied using molecular dynamics (MD) simulations. The mechanisms of molecular transference, alkanethiol meniscus characteristics, surface adsorbed energy, number of molecular transfer, contact angle and pattern characteristics are evaluated during the DPN process at room temperature. The simulation results clearly show that the molecular transfer ability in DPN is optimum for deposition on a smooth surface, because surface defects create a potential diffusion barrier for the control of the spreading of excess ink molecules. The adsorbed area of SAMs, number of molecular transfer and pattern size are significantly inversely proportional to the degrees of roughness of a substrate. The adsorbed area of SAMs is increased by the pull-off process and the growth rate of adsorbed area is about 11–38%. The effect of surface roughness on the DPN process can be decreased by increasing the indentation depth of a tip
Availability note (English)
Available from http://dx.doi.org/10.1088/0965-0393/19/6/065008Additional details
Identifiers
- DOI
- 10.1088/0965-0393/19/6/065008;
- PII
- S0965-0393(11)82159-5;
Publishing Information
- Journal Title
- Modelling and Simulation in Materials Science and Engineering
- Journal Volume
- 19
- Journal Issue
- 6
- Journal Page Range
- [10 p.]
- ISSN
- 0965-0393
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45006312
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEFECTS; DEPOSITION; DIFFUSION BARRIERS; MOLECULAR DYNAMICS METHOD; ROUGHNESS; SIMULATION; SUBSTRATES; SURFACES
- Descriptors DEC
- CALCULATION METHODS; SURFACE PROPERTIES