Published 1994 | Version v1
Book

Particle induced x-ray emission (PIXE) analysis of environmental samples

  • 1. Institute of Physics, Bhubaneswar (India)
  • 2. Acharya Harihar Regional Centre for Cancer Research and Treatment, Cuttack (India)

Description

Particle induced x-ray emission (PIXE) technique is well suited for analysis of environmental samples due to its multielemental capability (Na to U) and uniform sensitivity. The high absolute sensitivity of PIXE, makes it possible to perform analysis of very small size samples. Proton beams of 2-4 MeV obtained from the low energy tandem pelletron accelerator at Institute of Physics are being used for the trace element analysis of environmental samples like water, soil and fly ash. Experimental facility and sample preparation laboratory have been established for PIXE analysis of environmental samples. Very low detection limits have been obtained for trace element analysis of natural waters by PIXE method in combination with preconcentration technique. Sample collection, preparation, irradiation, experimental setup and spectrum evaluation are discussed. (author). 8 refs., 3 figs

Part of:
Proceedings of the third national symposium on environment with special emphasis on high background radiation areas

Additional details

Publishing Information

Publisher
Department of Atomic Energy.
Imprint Place
Bombay (India)
Imprint Title
Proceedings of the third national symposium on environment with special emphasis on high background radiation areas
Imprint Pagination
293 p.
Journal Page Range
p. 177-180.

Conference

Title
3. national symposium on environment with special emphasis on high background radiation areas.
Dates
1-4 Mar 1994.
Place
Thiruvananthapuram (India).

Optional Information