Published June 2010 | Version v1
Report Metadata-only

Response to the cosmic-ray heavy ion particles of hard X-ray and gamma-ray detectors on board the ASTRO-H satellite

Creators

  • 1. Japan Aerospace Exploration Agency, Inst. of Space and Astronautical Science, Sagamihara, Kanagawa (Japan)

Description

We have been developing the Hard X-ray Imager (HXI) and Soft Gamma-ray Detector (SGD) which will be carried by the ASTRO-H satellite in the FY2013. The main object of the experiment is to study the detector response against the high energy cosmic-ray ions on ground, for the purpose of constructing detailed response functions. The other goal is to confirm the high tolerability of ASICs which will be used in the flight models of detector for the large energy deposit caused by heavy ions in orbit. (author)

Part of:
2009 annual report of the research project with heavy ions at NIRS-HIMAC

Additional details

Identifiers

URL
http://id.nii.ac.jp/1657/00073735/;

Publishing Information

Imprint Title
2009 annual report of the research project with heavy ions at NIRS-HIMAC
Imprint Pagination
338 p.
Journal Page Range
p. 270-271
Report number
NIRS-M--234

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
53067039
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ASTRON SATELLITES; CDTE SEMICONDUCTOR DETECTORS; COMPTON EFFECT; COMPUTERIZED SIMULATION; COSMIC RADIATION; ENERGY SPECTRA; GAMMA RADIATION; HARD X RADIATION; HEAVY IONS; LEAKAGE CURRENT; MOLYBDENUM; MONTE CARLO METHOD; PHOTODIODES; PLASTIC SCINTILLATORS; SI SEMICONDUCTOR DETECTORS
Descriptors DEC
CALCULATION METHODS; CHARGED PARTICLES; CURRENTS; ELASTIC SCATTERING; ELECTRIC CURRENTS; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; FUNDAMENTAL INTERACTIONS; INTERACTIONS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; METALS; PHOSPHORS; RADIATION DETECTORS; RADIATIONS; REFRACTORY METALS; SATELLITES; SCATTERING; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SIMULATION; SPECTRA; TRANSITION ELEMENTS; X RADIATION

Optional Information

Notes
This record replaces 45039851
Secondary number(s)
HIMAC--134