Published 2011 | Version v1
Journal article

In-situ characterization of embedded metallic nano-clusters with a positron beam

  • 1. Technische Universitaet Muenchen, Physikdepartment E21, Garching (Germany)
  • 2. ZWE FRM-II, Garching (Germany)

Description

Positron measurements on model systems of aluminum with thin embedded layers (0.5nm to 100nm) of different materials (Au, Cr and Cu) are reported. It is shown how the positron affinity of different metals affects the measurements sensitivity. It is demonstrated that temperature dependent Doppler broadening on gold clusters embedded in aluminum reveals clustering and re-organization processes. When a positron is implanted into a sample, it thermalizes rapidly (within ps) and starts to diffuse over up to several hundred lattice constants. During the diffusion it can be trapped at irregularities in the crystal matrix. Hence it acts as a ''nanoprobe'' with a highly increased sensitivity e.g. for vacancy-like defects and metallic agglomerations. The non-destructiveness of this method enables in-situ observation of agglomeration growth at different temperatures. The usage of a mononergetic positron beam assures the positron implantation into the bulk where surface effects do not influence the measurement.

Additional details

Publishing Information

Journal Title
Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue
Dresden 2011 issue
Series
Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 46(1)
Journal Page Range
[1 p.]
ISSN
0420-0195
CODEN
VDPEAZ

Conference

Title
75. Annual meeting of the DPG and combined DPG Spring meeting of the condensed matter section and the section AMOP with further DPG divisions environmental physics, history of physics, microprobes, radiation and medical physics, as well as the working groups energy, equal opportunities, industry and business, information, philosophy of physics, physics and disarmament, young DPG
Dates
13-18 Mar 2011
Place
Dresden (Germany)

Optional Information

Notes
Session: MM 27.1 Mi 14:30; No further information available