Geant4 simulation of the new CENBG micro and nanoprobes facility
- 1. Centre d'Etudes Nucleaires de Bordeaux-Gradignan, CNRS/IN2P3, Universite Bordeaux 1, BP 120, Le Haut Vigneau, F-33175 Gradignan Cedex (France)
Description
The Centre d'Etudes Nucleaires de Bordeaux-Gradignan (CENBG) will soon be equipped with a new state of the art accelerator facility including a single-ended HVEE[reg] 3.5 MV Singletron. Its performance in terms of brightness and energy stability will provide the unique opportunity to develop a high spatial resolution nanobeam line. The actual microbeam line dedicated to ion beam analysis (scanning transmission ion microscopy, particle induced X-ray emission and Rutherford backscattering spectrometry) and to cellular irradiation will be reinstalled on the new machine. In this paper, expected performances of the two beam lines are presented from ray tracing simulations using the Geant4 toolkit, capabilities of which at the sub-micron scale have been investigated and validated previously
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2006.03.130;
- PII
- S0168-583X(06)00366-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 249
- Journal Issue
- 1-2
- Journal Page Range
- p. 738-742
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 17. international conference on ion beam analysis
- Dates
- 26 Jun - 1 Jul 2005
- Place
- Sevilla (Spain)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38035606
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATOR FACILITIES; BRIGHTNESS; ION BEAMS; ION MICROSCOPY; IRRADIATION; MONTE CARLO METHOD; PERFORMANCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SIMULATION; SPATIAL RESOLUTION; X RADIATION
- Descriptors DEC
- BEAMS; CALCULATION METHODS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSCOPY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RESOLUTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.