Published August 2006 | Version v1
Journal article

Geant4 simulation of the new CENBG micro and nanoprobes facility

  • 1. Centre d'Etudes Nucleaires de Bordeaux-Gradignan, CNRS/IN2P3, Universite Bordeaux 1, BP 120, Le Haut Vigneau, F-33175 Gradignan Cedex (France)

Description

The Centre d'Etudes Nucleaires de Bordeaux-Gradignan (CENBG) will soon be equipped with a new state of the art accelerator facility including a single-ended HVEE[reg] 3.5 MV Singletron. Its performance in terms of brightness and energy stability will provide the unique opportunity to develop a high spatial resolution nanobeam line. The actual microbeam line dedicated to ion beam analysis (scanning transmission ion microscopy, particle induced X-ray emission and Rutherford backscattering spectrometry) and to cellular irradiation will be reinstalled on the new machine. In this paper, expected performances of the two beam lines are presented from ray tracing simulations using the Geant4 toolkit, capabilities of which at the sub-micron scale have been investigated and validated previously

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.03.130;
PII
S0168-583X(06)00366-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
249
Journal Issue
1-2
Journal Page Range
p. 738-742
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
17. international conference on ion beam analysis
Dates
26 Jun - 1 Jul 2005
Place
Sevilla (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38035606
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATOR FACILITIES; BRIGHTNESS; ION BEAMS; ION MICROSCOPY; IRRADIATION; MONTE CARLO METHOD; PERFORMANCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SIMULATION; SPATIAL RESOLUTION; X RADIATION
Descriptors DEC
BEAMS; CALCULATION METHODS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSCOPY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RESOLUTION; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.