Published 1992 | Version v1
Miscellaneous

Quantitative structural analysis of superlattices from X-ray profile refinement

  • 1. Katholieke Universiteit, Leuven (Belgium). Laboratorium voor Vaste Stof-Fysika en Magnetisme
  • 2. California Univ., San Diego, La Jolla, CA (United States). Dept. of Physics

Description

Abstract only

Part of:
12th general conference of the condensed matter division of the E.P.S. V.16A

Additional details

Publishing Information

Imprint Title
12th general conference of the condensed matter division of the E.P.S. V.16A.
Imprint Pagination
394 p.
Journal Page Range
p. 178.
Report number
INIS-mf--13336

Conference

Title
12. general conference of the condensed matter division.
Dates
6-9 Apr 1992.
Place
Prague (Czechoslovakia).

INIS

Country of Publication
Serbia and Montenegro
Country of Input or Organization
Serbia and Montenegro
INIS RN
23069376
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
CRYSTAL LATTICES; LATTICE PARAMETERS; S CODES; SUPERLATTICES; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; COMPUTER CODES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SCATTERING

Optional Information