Spectromicroscopy study of interfacial Co/NiO(001)

Photoemission electron microscopy (PEEM) with linearly polarized x-rays is used to determine the orientation of antiferromagnetic domains by monitoring the relative peak intensities at the 3d transition metal L2 absorption edge. In such an analysis the orientations of the x-ray polarization E and magnetization H with respect to the crystalline axes has to be taken into account. We address this problem by presenting a general expression of the angular dependence for both x-ray absorption spectroscopy and x-ray magnetic linear dichroism (XMLD) for arbitrary direction of E and H in the (001) cubic plane. In cubic symmetry the angular dependent XMLD is a linear combination of two spectra with different photon energy dependence, which reduces to one spectrum when E or H is along a high-symmetry axis. The angular dependent XMLD can be separated into an isotropic term, which is symmetric along H, and an anisotropic term, which depends on the orientation of the crystal axes. The anisotropic term has maximal intensity when E and H have equal but opposite angles with respect to the (100) direction. The Ni2+ L2 edge has the peculiarity that the isotropic term vanishes, which means that the maximum in the XMLD intensity is observed not only for E (parallel) H (parallel) (100) but also for (E (parallel) (110), H (parallel) (110)). We apply the angular dependent theory to determine the spin orientation near the Co/NiO(100) interface. The PEEM images show that the ferromagnetic Co moments and antiferromagnetic NiO moments are aligned perpendicular to each other. By rotating the sample with respect to the linear x-ray polarization we furthermore find that the perpendicular coupling with the ferromagnetic Co layer at the interface causes a canting of the antiferromagnetic Ni moments. This shows that taking into account the angular dependence of the XMLD in the detailed analysis of PEEM images leads to an accurate retrieval of the spin axes of the antiferromagnetic domains.