Structure of disordered matter and its measure though diffraction
Creators
- 1. Bristol Univ. (United Kingdom). H.H. Wills Physics Lab
- 2. Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Paris-11 Univ., 91 - Orsay (France)
- 3. Bath Univ., Dept. of Physics (United Kingdom)
Description
The understanding of the properties of glasses or of liquids requires the knowledge of the partial structure factors (PSF) that describe the spatial distribution of an atomic species around another one. Combining neutron diffraction techniques (particularly the one with isotopic substitution: NDIS) with the anomalous X-ray scattering technique (AXS) allows us to get a better contrast in terms of scattering lengths but implies to carry out a thorough data analysis because the handling of systematic errors is different for the 2 techniques. This method has previously been validated on atoms whose electron distributions are quasi-spherical. In the case of glasses with important covalent bonds, the use of this method is made easier when it deals with high atomic number elements. This paper describes the method from how PSF parameters are inferred from differential cross sections, to the application to AXS and to NDIS. (A.C.)
Additional details
Additional titles
- Original title (French)
- La structure des systemes desordonnes et sa mesure par diffraction
Publishing Information
- Journal Title
- Journal de Physique. 4
- Journal Volume
- 111
- Journal Page Range
- p. 59-96
- ISSN
- 1155-4339
- CODEN
- JPICEI
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 35051039
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DATA COVARIANCES; DIFFERENTIAL CROSS SECTIONS; GLASS; NEUTRON DIFFRACTION; STRUCTURE FACTORS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CROSS SECTIONS; DIFFRACTION; SCATTERING
Optional Information
- Notes
- 41 refs.