Measurement of transmission of VUV monochromators and electron spectrometers using photoemission spectroscopy

In many applications of photoemission spectroscopy it is necessary to know the relative photoelectron yield from a sample as a function of energy. Two aspects of this measurement are specific to synchrotron radiation sources. We first present a method of extracting the monochromatic contribution from an absorption measurement which includes harmonics of the primary frequency as well as scattered light. In addition, this measurement is a useful way to characterize VUV monochromators. Secondly, we present an analysis of the transmission of electron spectrometers when viewing a source of the dimensions of a synchrotron radiation source. This is midway between the well-characterized cases of flooded sources (such as an X-ray source) and point sources (such as an electron gun). (orig.)