Published December 1, 2017
| Version v1
Journal article
Direct evidence of traps controlling the carriers transport in SnO2 nanobelts
- 1. LCCTnano, Departamento de Física e Química - Universidade Estadual Paulista (Unesp), Faculdade de Engenharia de Guaratinguetá, Câmpus Guaratinguetá, São Paulo (Brazil)
- 2. NanO LaB - Departamento de Física, Universidade Federal de São Carlos, CEP 13565-905, CP 676, São Carlos, São Paulo (Brazil)
Description
This work reports on direct evidence of localized states in undoped SnO2 nanobelts. Effects of disorder and electron localization were observed in Schottky barrier dependence on the temperature and in thermally stimulated currents. A transition from thermal activation to hopping transport mechanisms was also observed. The energy levels found by thermally stimulated current experiments were in close agreement with transport data confirming the role of localization in determining the properties of devices. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/38/12/122001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 38
- Journal Issue
- 12
- Journal Page Range
- [5 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51064544
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CARRIERS; CURRENTS; DIFFUSION BARRIERS; ENERGY LEVELS; EQUIPMENT; NANOSTRUCTURES; TIN OXIDES
- Descriptors DEC
- CHALCOGENIDES; OXIDES; OXYGEN COMPOUNDS; TIN COMPOUNDS