Published December 1, 2017 | Version v1
Journal article

Direct evidence of traps controlling the carriers transport in SnO2 nanobelts

  • 1. LCCTnano, Departamento de Física e Química - Universidade Estadual Paulista (Unesp), Faculdade de Engenharia de Guaratinguetá, Câmpus Guaratinguetá, São Paulo (Brazil)
  • 2. NanO LaB - Departamento de Física, Universidade Federal de São Carlos, CEP 13565-905, CP 676, São Carlos, São Paulo (Brazil)

Description

This work reports on direct evidence of localized states in undoped SnO2 nanobelts. Effects of disorder and electron localization were observed in Schottky barrier dependence on the temperature and in thermally stimulated currents. A transition from thermal activation to hopping transport mechanisms was also observed. The energy levels found by thermally stimulated current experiments were in close agreement with transport data confirming the role of localization in determining the properties of devices. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/38/12/122001

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
38
Journal Issue
12
Journal Page Range
[5 p.]
ISSN
1674-4926

INIS

Country of Publication
China
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51064544
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
CARRIERS; CURRENTS; DIFFUSION BARRIERS; ENERGY LEVELS; EQUIPMENT; NANOSTRUCTURES; TIN OXIDES
Descriptors DEC
CHALCOGENIDES; OXIDES; OXYGEN COMPOUNDS; TIN COMPOUNDS