Published April 2010 | Version v1
Journal article

Off-axis and inline electron holography: A quantitative comparison

  • 1. Max Planck Institute for Metals Research, Heisenbergstr. 3, 70569 Stuttgart (Germany)
  • 2. TU Dresden, 01062 Dresden (Germany)

Description

Capable of quantitatively imaging static magnetic and electric potentials and even strain electron holography is a very versatile and powerful TEM technique. In this paper we compare off-axis electron holography with a recently developed focal series reconstruction algorithm and phase retrieval based on the transport of intensity equation. Based on theoretical considerations and simulations we compare the different techniques with respect to parameters such as the coherence requirements, field of view, resolution, noise properties, and other required experimental conditions.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2009.11.022

Additional details

Identifiers

DOI
10.1016/j.ultramic.2009.11.022;
PII
S0304-3991(09)00267-8;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
110
Journal Issue
5
Journal Page Range
p. 460-471
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.