Published April 2010
| Version v1
Journal article
Off-axis and inline electron holography: A quantitative comparison
Creators
- 1. Max Planck Institute for Metals Research, Heisenbergstr. 3, 70569 Stuttgart (Germany)
- 2. TU Dresden, 01062 Dresden (Germany)
Description
Capable of quantitatively imaging static magnetic and electric potentials and even strain electron holography is a very versatile and powerful TEM technique. In this paper we compare off-axis electron holography with a recently developed focal series reconstruction algorithm and phase retrieval based on the transport of intensity equation. Based on theoretical considerations and simulations we compare the different techniques with respect to parameters such as the coherence requirements, field of view, resolution, noise properties, and other required experimental conditions.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2009.11.022Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2009.11.022;
- PII
- S0304-3991(09)00267-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 110
- Journal Issue
- 5
- Journal Page Range
- p. 460-471
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44102726
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALGORITHMS; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; ELECTRIC POTENTIAL; ELECTRONS; HOLOGRAPHY; ITERATIVE METHODS; NOISE; RESOLUTION; STRAINS; TRANSMISSION ELECTRON MICROSCOPY; WAVE FUNCTIONS
- Descriptors DEC
- CALCULATION METHODS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; EVALUATION; FERMIONS; FUNCTIONS; LEPTONS; MATHEMATICAL LOGIC; MICROSCOPY; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.