Device for investigation of material emission properties

A device of ''merry-go-round'' type is described which is designed for measuring the emissive properties fo eight samples in the temperature range of 300 to 2300 K in a common vacuum volume. The device permits to introduce sensors and other means for the surface testing. Owing to a shorter time required for obtaining deep vacuum, the use of the device described considerably increases the productivity of labour as compared to other known devices for single samples. The work functions obtained with the use of the device for a number of metals are in good agreement with the data published elsewhere