Published March 2011 | Version v1
Journal article

Spatially resolved measurements of electron cyclotron resonance ion source beam profile characteristics

  • 1. Institute for Experimental and Applied Physics (IEAP), University of Kiel, Kiel (Germany)

Description

Simulations predict that the concentric rings and the triangular structures in the profiles of strongly focused ion beams that are found in different experiments should be dominated by ion species with the same or at least similar m/q-ratio. To verify these theoretical predictions we have tuned our ECR ion source to deliver a beam consisting of multiple ion species whose particular m/q-depending focusing ranges from weakly focused to overfocused. We then recorded spatially resolved charge-state distributions of the beam profile at characteristic positions in the plane perpendicular to the beam line. The results validate theoretical predictions and are summarized in this paper. To achieve the required beam profile characteristics we moved the extraction along the beam line to achieve stronger focusing than by only changing the extraction voltage. To fit the regions of interest of the beam profile into the transmission area of the sector magnet, we steered the beam by moving the extraction in the plane perpendicular to the beam axis. The results of both investigations, beam focusing and beam steering by using a 3D-movable extraction, are also reported in this paper. A brief overview of the new beam monitor extensively used during these measurements, the Faraday cup array, is also given.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
82
Journal Issue
3
Journal Page Range
p. 033302-033302.7
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44021457
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BEAM EXTRACTION; BEAM PROFILES; CHARGE STATES; COMPUTERIZED SIMULATION; ECR ION SOURCES; ELECTRIC POTENTIAL; FARADAY CUPS; FOCUSING; ION BEAMS; MAGNETS; RINGS
Descriptors DEC
BEAM MONITORS; BEAMS; EQUIPMENT; ION SOURCES; MEASURING INSTRUMENTS; MONITORS; SIMULATION

Optional Information

Notes
(c) 2011 American Institute of Physics