Published June 2015 | Version v1
Journal article

Neutron diffraction study of parasitic Nd-moment order in the checkerboard-type phase Nd1.3Sr0.7NiO4

  • 1. Tokyo University, Institute for Solid-State Physics, Neutron Science Laboratory, Tokai, Ibaraki (Japan)
  • 2. Quantum Condensed Matter Division, Oak Ridge National Laboratory, Oak Ridge, TN (United States)
  • 3. Japan Atomic Energy Agency, J-PARC Center, Materials and Life Science Division, Tokai, Ibaraki (Japan)
  • 4. Tokyo University, Department of Applied Physics, Tokyo (Japan)

Description

The Nd-moment order in the layered nickelate Nd2-xSrxNiO4 (x = 0.7) has been investigated by performing a neutron diffraction experiment using a single crystal sample. First, the checkerboard (CB)-type charge order was confirmed by observing the temperature dependence of the nuclear superlattice peak at Q=(5, 0, 0) between 1.9 and 300 K, which indicates that the transition temperature of the CB-type charge order is above 300 K. Magnetic superlattice peaks with the propagation vector k=(1-ε, 0, 1) appear below 67 K, and the value of ε was determined to be 0.455 in good agreement with previous studies. The intensity of the magnetic superlattice peaks appearing below 67 K shows a sharp increase below ≈20 K. This behavior indicates that the Nd moments freeze under the influence of the Ni ordering. The CB-type antiferromagnetic (AFM) Ni order in the NiO2 layers is stacked antiferromagnetically in the c-axis direction, while the Nd moments in the Nd/SrO2 layers are coupled antiferromagnetically with the Ni moments. The Nd moments are parallel to the c-axis, while the Ni moments are canted towards the c-axis direction from the basal ab-plane at low temperatures where the Nd moments are well ordered. (author)

Availability note (English)

Available from http://dx.doi.org/10.7566/JPSJ.84.064711

Additional details

Identifiers

Publishing Information

Journal Title
Journal of the Physical Society of Japan
Journal Volume
84
Journal Issue
6
Journal Page Range
p. 064711.1-064711.6
ISSN
0031-9015

Optional Information

Notes
11 refs., 5 figs., 1 tab.