Published September 21, 2001 | Version v1
Journal article Metadata-only

Analysis of artifact with X-ray CT using energy band by photon counting CdTe detector

Creators

  • 1. Department of Bioengineering, Toledo University, Toledo, OH 43606-3390 (United States)
  • 2. Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011 (Japan)

Description

This report analyzes the imaging errors in what are called 'artifacts' by a CdTe detector with the energy differentiation ability using the photon counting mode. The selection of specific energy level in each metal sample allows nominating the images with less artifact. In addition, inspection of μx is the supportive method to judge the energy level. Photon counting CdTe detector with the energy differentiation ability is a system that can provide the information of projection data at different energy bands to establish the accuracy image of any materials.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.05.056

Additional details

Identifiers

DOI
10.1016/j.nima.2010.05.056;
PII
S0168-9002(10)01178-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
621
Journal Issue
1-3
Journal Page Range
p. 292-294
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42011998
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; CDTE SEMICONDUCTOR DETECTORS; ENERGY LEVELS; ERRORS; INFORMATION; INSPECTION; PHOTONS; X RADIATION
Descriptors DEC
BOSONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; IONIZING RADIATIONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.