Published May 2014 | Version v1
Miscellaneous Metadata-only

Characteristics Measurement of CdWO4 Crystal and Photo PIN Diode for X-ray Scanner

Creators

  • 1. Kyungpook National Univ., Daegu (Korea, Republic of)
  • 2. Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of)

Description

CWO is commonly used in X-ray scanner due to its detection efficiency and low after glow. We measured a decay time, emission wavelength, and light yield of CWO. And we measure signal-to-noise ratio (SNR) and energy resolution of γ-ray with CsI(Tl) by using the PD. Measurements results determine quality of the CWO crystal and PD. After this study, we will study X-ray response by using combined CWO and PD

Part of:
Proceedings of the KNS 2014 spring meeting

Additional details

Publishing Information

Publisher
KNS
Imprint Place
Daejeon (Korea, Republic of)
Imprint Title
Proceedings of the KNS 2014 spring meeting
Imprint Pagination
[1 CD-ROM]
Journal Page Range
[3 p.]

Conference

Title
2014 spring meeting of the KNS
Dates
28-30 May 2014
Place
Jeju (Korea, Republic of)

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
46050676
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BEAM SCANNERS; DECAY; ENERGY RESOLUTION; INSPECTION; SIGNAL-TO-NOISE RATIO
Descriptors DEC
BEAM MONITORS; DIMENSIONLESS NUMBERS; MEASURING INSTRUMENTS; MONITORS; RESOLUTION

Optional Information

Notes
2 refs, 9 figs