High-resolution permanent photoresist laminate TMMF for sealed microfluidic structures in biological applications
Creators
- 1. Laboratory for MEMS Applications, Department of Microsystems Engineering—IMTEK, University of Freiburg (Germany)
- 2. Laboratory for Process Technology, Department of Microsystems Engineering—IMTEK, University of Freiburg (Germany)
- 3. Department of Pharmaceutical Technology and Biopharmacy, University of Freiburg (Germany)
- 4. HSG-IMIT, Wilhelm-Schickard-Straße 10, 78052 Villingen-Schwenningen (Germany)
Description
We demonstrate the use of photosensitive epoxy laminate TMMF S2045 for the fabrication and sealing of tapered microfluidic channels. The 45 µm thick resist enables the fabrication of shallow sealed cavities featuring extreme aspect ratios of less than 1:40 (h = 45 µm, w = 2000 µm). It also provides high resolution and enables minimum feature sizes of 10 µm. For the fabrication of free-standing structures, an aspect ratio of up to 7:1 was achieved. The dry-film photoresist can be applied easily by lamination onto structured substrates. The total thickness variation of the resist across a 100 mm wafer was determined to be less than ±0.6 µm. Process parameters for the fabrication and sealing of various micro-channels are discussed and optimized in this paper. The main focus was to minimize thermal impact during lamination, soft-bake, exposure and post–exposure bake, which could lead to lid sagging or channel clogging due to liquefaction of uncured resist. We tested TMMF according to ISO 10995-5 and found it to be non-cytotoxic, enabling its use for biological applications. Swelling of less than 5% for incubation of the dry-film resist in several biologically relevant solvents, buffers and cleaning solutions was observed
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/21/9/095009Additional details
Identifiers
- DOI
- 10.1088/0960-1317/21/9/095009;
- PII
- S0960-1317(11)88336-1;
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 21
- Journal Issue
- 9
- Journal Page Range
- [9 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47010112
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ASPECT RATIO; BUFFERS; CRYSTAL DEFECTS; EPOXIDES; FABRICATION; FILMS; LIQUEFACTION; RESOLUTION; SUBSTRATES; SWELLING; THICKNESS
- Descriptors DEC
- CRYSTAL STRUCTURE; DEFORMATION; DIMENSIONLESS NUMBERS; DIMENSIONS; ORGANIC COMPOUNDS; ORGANIC OXYGEN COMPOUNDS; THERMOCHEMICAL PROCESSES