Microwave dielectric properties and microstructures of MgTa2O6 ceramics with CuO addition
Creators
- 1. Department of Electrical Engineering, National Cheng Kung University, No. 1 University Road, Tainan 70101, Taiwan (China)
- 2. Department of Resources Engineering, National Cheng Kung University, No. 1 University Road, Tainan 70101, Taiwan (China)
Description
The effect of CuO addition on the microstructures and the microwave dielectric properties of MgTa2O6 ceramics has been investigated. It is found that low level-doping of CuO (up to 1 wt.%) can significantly improve the density of the specimens and their microwave dielectric properties. Tremendous sintering temperature reduction can be achieved due to the liquid phase effect of CuO addition observed by scanning electronic microscopy (SEM). The sintered samples exhibit excellent microwave dielectric properties, which depend upon the liquid phase and the sintering temperature. With 0.5 wt.% CuO addition, MgTa2O6 ceramic can be sintered at 1400 deg. C and possesses a dielectric constant (εr) of 28, a Q x f value of 58000 GHz and a temperature coefficient of resonant frequency (τf) of 18 ppm/ deg. C
Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2004.10.037;
- PII
- S0254-0584(04)00552-8;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 90
- Journal Issue
- 2-3
- Journal Page Range
- p. 373-377
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37054382
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; COPPER OXIDES; MAGNESIUM COMPOUNDS; MHZ RANGE 01-100; MICROSTRUCTURE; MICROWAVE RADIATION; OXIDES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SINTERING; TANTALUM COMPOUNDS; TEMPERATURE COEFFICIENT
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COPPER COMPOUNDS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; FREQUENCY RANGE; MHZ RANGE; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; REACTIVITY COEFFICIENTS; REFRACTORY METAL COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.