Published February 21, 2011
| Version v1
Journal article
Strain-induced metal to semiconductor transition in ultra-small diameter single-wall carbon nanotubes
Creators
- 1. Laboratory of Thin Film Materials, College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124 (China)
- 2. School of Mathematics and Statistics, Wuhan University, Wuhan 430027 (China)
- 3. School of Optoelectronics, Beijing Institute of Technology, Beijing 100081 (China)
Description
Under a large tensile strain near fracture limit, the band structures of single-wall carbon nanotubes (SWCNTs) with diameter less than 0.5 nm begin a metal to semiconductor transition and these ultra-small SWCNTs can normally maintain their metallicities. The band gap behavior of these SWCNTs intrinsically originates from the long axial direct bond lengths and the severe curvature. The gap opening comes mainly from the transfer of pπ electrons. And the localized π and σ states can result in a lower electrical conductivity. This band gap behavior suggests that it has potential to find applications in nano-electromechanical system.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2011.01.039Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2011.01.039;
- PII
- S0375-9601(11)00087-9;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 375
- Journal Issue
- 8
- Journal Page Range
- p. 1200-1204
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42097231
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BOND LENGTHS; CARBON; ELECTRIC CONDUCTIVITY; ELECTRONS; METALS; NANOTUBES; PHASE TRANSFORMATIONS; SEMICONDUCTOR MATERIALS; STRAINS
- Descriptors DEC
- DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LENGTH; LEPTONS; MATERIALS; NANOSTRUCTURES; NONMETALS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.