Published May 21, 2012 | Version v1
Journal article

Xenon purity analysis for EXO-200 via mass spectrometry

  • 1. Physics Department, University of Maryland, College Park, MD (United States)
  • 2. Physics Department, Laurentian University, Sudbury, ON (Canada)
  • 3. LHEP, Physikalisches Institut, University of Bern, Bern (Switzerland)
  • 4. Physics Department, Stanford University, Stanford, CA (United States)
  • 5. Physics Department, Colorado State University, Fort Collins, CO (United States)
  • 6. SLAC National Accelerator Laboratory, Menlo Park, CA (United States)
  • 7. Physics Department, University of Massachusetts, Amherst, MA (United States)
  • 8. Physics Department, Carleton University, Ottawa (Canada)

Description

We describe purity measurements of the natural and enriched xenon stockpiles used by the EXO-200 double beta decay experiment based on a mass spectrometry technique. The sensitivity of the spectrometer is enhanced by several orders of magnitude by the presence of a liquid nitrogen cold trap, and many impurity species of interest can be detected at the level of one part-per-billion or better. We have used the technique to screen the EXO-200 xenon before, during, and after its use in our detector, and these measurements have proven useful. This is the first application of the cold trap mass spectrometry technique to an operating physics experiment.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2012.01.066

Additional details

Identifiers

DOI
10.1016/j.nima.2012.01.066;
arXiv
arXiv:1109.1046v1;
PII
S0168-9002(12)00126-X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
675
Journal Page Range
p. 40-46
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44115838
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COLD TRAPS; DOUBLE BETA DECAY; IMPURITIES; LIQUIDS; MASS SPECTROSCOPY; NITROGEN; SENSITIVITY; SPECTROMETERS; XENON
Descriptors DEC
BETA DECAY; BETA-MINUS DECAY; DECAY; ELEMENTS; FLUIDS; GASES; MEASURING INSTRUMENTS; NONMETALS; NUCLEAR DECAY; RARE GASES; SPECTROSCOPY; TRAPS; VAPOR CONDENSERS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.