Published December 15, 2007 | Version v1
Journal article

Structural vs electronic origin of renormalized band widths in TTF-TCNQ: An angular dependent NEXAFS study

  • 1. Experimentelle Physik IV, Universitaet Wuerzburg, D-97074 Wuerzburg (Germany)
  • 2. Experimentalphysik II, Universitaet Augsburg, D-86135 Augsburg (Germany)
  • 3. Institute of Materials Chemistry, Vienna University of Technology, A-1060 Vienna (Austria)
  • 4. Institut fuer Physik, Technische Universitaet Chemnitz, D-09107 Chemnitz (Germany)
  • 5. Department of Physics, Technical University of Denmark, DK-2800 Lyngby (Denmark)

Description

We have performed angle-dependent near-edge x-ray absorption fine structure measurements in the Auger electron yield mode on the correlated quasi-one-dimensional organic conductor tetrathiafulvalene-tetracyanoquinodimethane (TTF-TCNQ) in order to determine the orientation of the molecules in the topmost surface layer. We find that the tilt angles of the molecules with respect to the one-dimensional axis are essentially the same as in the bulk. Thus, we can rule out surface relaxation as the origin of the renormalized band widths which were inferred from the analysis of photoemission data within the one-dimensional Hubbard model. Thereby, recent theoretical results are corroborated which invoke long-range Coulomb repulsion as alternative explanation to understand the spectral dispersions of TTF-TCNQ quantitatively within an extended Hubbard model

Additional details

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
76
Journal Issue
24
Journal Page Range
p. 245119-245119.7
ISSN
1098-0121

Optional Information

Notes
(c) 2007 The American Physical Society