Temperature dependence of electrical resistivity of high-Tc cuprates--from pseudogap to overdoped regions
Description
The effects of planar hole concentration, p, and in-plane disorder, Zn (y), on the DC resistivity, ρ(T), of sintered samples of Y1-xCaxBa2(Cu1-yZny)3O7-δ were investigated over a wide doping range by changing both the oxygen deficiency (δ) and Ca content (x). From the ρ(T,p) data we extracted characteristic crossover temperatures on the underdoped and overdoped sides, T* and Tm respectively, above which ρ(T) is linear. We compare our results with a number of other polycrystalline, thin film and single crystal cuprate superconductors and find similar behavior in the p-dependence of T*(p), Tm(p), and the resistivity exponent, m(p), in fits to ρ(T)=ρ0+aTm on the overdoped side. Our findings suggest that the doping level p=0.19±0.01 is special and could possibly be a quantum critical point in the sense that a transition between two different states takes place at zero temperature at this doping (pcrit)
Additional details
Identifiers
- DOI
- 10.1016/S0921-4534;
- PII
- S0921453402023304;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 387
- Journal Issue
- 3-4
- Journal Page Range
- p. 365-372
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37074241
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BARIUM COMPOUNDS; CALCIUM COMPOUNDS; COMPARATIVE EVALUATIONS; CUPRATES; ELECTRIC CONDUCTIVITY; HIGH-TC SUPERCONDUCTORS; HOLES; MONOCRYSTALS; OXYGEN; POLYCRYSTALS; TEMPERATURE DEPENDENCE; THIN FILMS; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COPPER COMPOUNDS; CRYSTALS; ELECTRICAL PROPERTIES; ELEMENTS; EVALUATION; FILMS; NONMETALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.