Making silicon hydrophobic: wettability control by two-lengthscale simultaneous patterning with femtosecond laser irradiation
Creators
- 1. Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 711 10, Heraklion, Crete (Greece)
- 2. National Nanotechnology Laboratory (NNL) of National Research Council (CNR), Via Arnesano, 73100, Lecce (Italy)
Description
We report on the wettability properties of silicon surfaces, simultaneously structured on the micrometre-scale and the nanometre-scale by femtosecond (fs) laser irradiation to render silicon hydrophobic. By varying the laser fluence, it was possible to control the wetting properties of a silicon surface through a systematic and reproducible variation of the surface roughness. In particular, the silicon-water contact angle could be increased from 660 to more than 130 deg. Such behaviour is described by incomplete liquid penetration within the silicon features, still leaving partially trapped air inside. We also show how controllable design and tailoring of the surface microstructures by wettability gradients can drive the motion of the drop's centre of mass towards a desired direction (even upwards)
Availability note (English)
Available online at http://stacks.iop.org/0957-4484/17/3234/nano6_13_026.pdf or at the Web site for the journal Nanotechnology (Print) (ISSN 1361-6528 ) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0957-4484/17/3234/nano6_13_026.pdf; http://www.iop.org/;
- DOI
- 10.1088/0957-4484/17/13/026;
- PII
- S0957-4484(06)16802-6;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 17
- Journal Issue
- 13
- Journal Page Range
- p. 3234-3238
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38007115
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- AIR; CENTER-OF-MASS SYSTEM; LASER RADIATION; MICROSTRUCTURE; ROUGHNESS; SILICON; SURFACES; WATER; WETTABILITY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; HYDROGEN COMPOUNDS; OXYGEN COMPOUNDS; RADIATIONS; SEMIMETALS; SURFACE PROPERTIES