Published July 14, 2006 | Version v1
Journal article

Making silicon hydrophobic: wettability control by two-lengthscale simultaneous patterning with femtosecond laser irradiation

  • 1. Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 711 10, Heraklion, Crete (Greece)
  • 2. National Nanotechnology Laboratory (NNL) of National Research Council (CNR), Via Arnesano, 73100, Lecce (Italy)

Description

We report on the wettability properties of silicon surfaces, simultaneously structured on the micrometre-scale and the nanometre-scale by femtosecond (fs) laser irradiation to render silicon hydrophobic. By varying the laser fluence, it was possible to control the wetting properties of a silicon surface through a systematic and reproducible variation of the surface roughness. In particular, the silicon-water contact angle could be increased from 660 to more than 130 deg. Such behaviour is described by incomplete liquid penetration within the silicon features, still leaving partially trapped air inside. We also show how controllable design and tailoring of the surface microstructures by wettability gradients can drive the motion of the drop's centre of mass towards a desired direction (even upwards)

Availability note (English)

Available online at http://stacks.iop.org/0957-4484/17/3234/nano6_13_026.pdf or at the Web site for the journal Nanotechnology (Print) (ISSN 1361-6528 ) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
17
Journal Issue
13
Journal Page Range
p. 3234-3238
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38007115
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
AIR; CENTER-OF-MASS SYSTEM; LASER RADIATION; MICROSTRUCTURE; ROUGHNESS; SILICON; SURFACES; WATER; WETTABILITY
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; HYDROGEN COMPOUNDS; OXYGEN COMPOUNDS; RADIATIONS; SEMIMETALS; SURFACE PROPERTIES