Published November 2013 | Version v1
Journal article

Active inductor shunt peaking in high-speed VCSEL driver design

  • 1. Southern Methodist University, Dallas (United States)
  • 2. State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei (China)
  • 3. Institute of Physics, Academia Sinica, Nangang, Taipei (China)

Description

An all-transistor active-inductor shunt-peaking structure has been used in a prototype of 8 Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25 μm Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all-transistor active-inductor shunt-peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been taped out, and the prototype has been proven by the preliminary electrical test results and bit error ratio test results. The driver achieves 8 Gbps data rate as simulated with the peaking. We present the all-transistor active-inductor shunt-peaking structure, simulation and test results in this paper. (authors)

Availability note (English)

Available from DOI: http://dx.doi.org/10.1088/1674-1137/37/11/116101

Additional details

Publishing Information

Journal Title
Chinese Physics. C, High Energy Physics and Nuclear Physics
Journal Volume
37
Journal Issue
11
Journal Page Range
[4 p.]
ISSN
1674-1137

Optional Information

Notes
6 figs., 1 tabs., 4 refs.; This record replaces 46127673