Published April 2011 | Version v1
Journal article

A 150-nA 13.4-ppm/deg. C switched-capacitor CMOS sub-bandgap voltage reference

  • 1. State Key Laboratory of ASIC and Systems, Fudan University, Shanghai 201203 (China)

Description

A nanopower switched-capacitor CMOS sub-bandgap voltage reference has been implemented using a Chartered 0.35-μm 3.3-V/5-V dual gate mixed-signal CMOS process. The proposed circuit generates a precise sub-bandgap voltage of 1 V. The temperature coefficient of the output voltage is 13.4 ppm/deg. C with the temperature varying from -20 to 80 deg. C. The proposed circuit operates properly with the supply voltage down to 1.3 V, and consumes 150 nA at room temperature. The line regulation is 0.27%/V. The power supply rejection ratio at 100 Hz and 1 MHz is -39 dB and -51 dB, respectively. The chip area is 0.2 mm2. (semiconductor integrated circuits)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/32/4/045011

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
32
Journal Issue
4
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43015562
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CAPACITORS; ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; SEMICONDUCTOR MATERIALS; SIGNALS; TEMPERATURE COEFFICIENT
Descriptors DEC
ELECTRICAL EQUIPMENT; ELECTRONIC CIRCUITS; EQUIPMENT; MATERIALS; MICROELECTRONIC CIRCUITS; REACTIVITY COEFFICIENTS