Published April 2011
| Version v1
Journal article
A 150-nA 13.4-ppm/deg. C switched-capacitor CMOS sub-bandgap voltage reference
Creators
- 1. State Key Laboratory of ASIC and Systems, Fudan University, Shanghai 201203 (China)
Description
A nanopower switched-capacitor CMOS sub-bandgap voltage reference has been implemented using a Chartered 0.35-μm 3.3-V/5-V dual gate mixed-signal CMOS process. The proposed circuit generates a precise sub-bandgap voltage of 1 V. The temperature coefficient of the output voltage is 13.4 ppm/deg. C with the temperature varying from -20 to 80 deg. C. The proposed circuit operates properly with the supply voltage down to 1.3 V, and consumes 150 nA at room temperature. The line regulation is 0.27%/V. The power supply rejection ratio at 100 Hz and 1 MHz is -39 dB and -51 dB, respectively. The chip area is 0.2 mm2. (semiconductor integrated circuits)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/32/4/045011Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 32
- Journal Issue
- 4
- Journal Page Range
- [6 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43015562
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CAPACITORS; ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; SEMICONDUCTOR MATERIALS; SIGNALS; TEMPERATURE COEFFICIENT
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELECTRONIC CIRCUITS; EQUIPMENT; MATERIALS; MICROELECTRONIC CIRCUITS; REACTIVITY COEFFICIENTS