Published November 1990 | Version v1
Journal article

High-temperature defect structure of lanthanum cuprate

  • 1. Dept. of Materials Science and Engineering, Materials Research Center, Technological Inst. of Northwestern Univ., Evanston, IL (United States)

Description

High-temperature (650 degrees to 850 degrees C) electrical conductivity and Seebeck coefficient measurements as functions of oxygen partial pressure and temperature in polycrystalline lanthanum cuprate support a defect model consisting of oxygen interstitials charge compensated by electron holes. The La:Cu ratio was therefore estimated to be 2.000 ± 0.001. By comparison with existing oxygen nonstoichiometry data, the high-temperature electron hole mobility and density-of-states were estimated

Additional details

Publishing Information

Journal Title
Journal of the American Ceramic Society
Journal Volume
73
Journal Issue
11
Series
J. Am. Ceram. Soc.
Journal Page Range
3453-3456
ISSN
0002-7820
CODEN
JACTA

Optional Information