Structural elucidation of active layers in organic electronic devices via NEXAFS

The electrically-active thin films within organic electronic devices are structurally complex; the details of which depend strongly on both inherent materials properties as well as processing history. Given structural heterogeneities within such electrically-active thin films can influence device characteristics dramatically, understanding - and ultimately, controlling - structural development is a necessary precursor to producing reliable and high-performance electronic devices. Highlighted herein are several examples from our laboratories in which synchrotron soft x-rays based near-edge x-ray absorption fine structure spectroscopy is used to elucidate (i) ensemble-average molecular orientation (ii) relative surface coverage and (iii) vertical compositional profile in such electrically-active thin films.