Published August 2019 | Version v1
Journal article

Force sensor fabrication by AgNWs film using 532 nm pulses laser

  • 1. Taiwan Instrument Research Institute, National Applied Research Laboratories, Hsinchu, 30076 (China)

Description

This current study investigated the effects of laser direct writing (LDW) on the capacitance force sensor of a poly(3,4-ethylenedioxythiophene):poly(styrene sulfonic acid) film mixer with silver nanowire thin films by using a 532-nm laser system. The technique was combined with various scanning speeds (i.e., 800, 1000, and 1200 mm s−1) to investigate the effectiveness of the force sensor. During interdigitated electrode fabrication, the laser fluence and laser pulse repetition frequency were fixed at 5.42 J/cm2 and 40 kHz, respectively. Nonloading force and various loading force states were used to test the function of the electrode under different LDW conditions. A best correlation coefficient of approximately 0.88 confirmed a linear functional dependence between the square of the pattern width and capacitance under the micromachining speed of 1000 mm s−1. Moreover, in the nonloading force state, the capacitance value increased with the increase in the electrode pattern width under a micromachining speed of 800 mm s−1. Regarding the loading force status, the capacitance increased when the loading force increased from 18 to 90 g. When the interdigitated pattern line width was 500 μm and electrode micromachining speed was 800 mm s−1, the maximum capacitance value was 71.5 pF under a loading force of 90 g.

Additional details

Identifiers

DOI
10.1016/j.apsusc.2019.04.171;
PII
S0169433219311730;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
484
Journal Page Range
p. 1019-1026
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55046227
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CAPACITANCE; ELECTRODES; KHZ RANGE; LASERS; LINE WIDTHS; MACHINING; PULSES; SENSORS; SULFONIC ACIDS; THIN FILMS
Descriptors DEC
ELECTRICAL PROPERTIES; FILMS; FREQUENCY RANGE; ORGANIC ACIDS; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.