General-purpose X-ray diffractometer
- 1. Inst. of Metal Physics, Kiev (Ukraine)
Description
The authors previously designed the first diffractometer which ensured simultaneous recording of both angular and energy diffraction patterns. Further improvement of the instrument led to designing a general-purpose diffractometer able to carry out in one setting x-ray photographing by the methods of angular and energy dispersion or by either of these methods separately. A structural diagram of this diffractometer is presented. This instrument is distinguished from the standard diffractometer mainly by the fact that the system for recording x-radiation is based on a multiparameter analyzer (MA). The MA is described in detail. The suggested hardware realization of the method of simultaneous recording of angular and energy-dispersion diffraction patterns based on a highly efficient and reliable PC with extensive system and applied software, including programs for processing spectra, provides qualitatively new possibilities of making the experimenter's work more convenient and productive. 4 refs., 3 figs., 1 tab
Additional details
Publishing Information
- Journal Title
- Industrial Laboratory
- Journal Volume
- 58
- Journal Issue
- 9
- Journal Page Range
- p. 857-862.
- ISSN
- 0019-8447
- CODEN
- INDLAP
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25011305
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- DESIGN; PARAMETRIC ANALYSIS; PHOTOGRAPHY; QUALITATIVE CHEMICAL ANALYSIS; SPECIFICATIONS; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; DIFFRACTOMETERS; MEASURING INSTRUMENTS
Optional Information
- Notes
- Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 58: No. 9, 43-46(Sep 1992).