Published March 1993 | Version v1
Journal article

General-purpose X-ray diffractometer

  • 1. Inst. of Metal Physics, Kiev (Ukraine)

Description

The authors previously designed the first diffractometer which ensured simultaneous recording of both angular and energy diffraction patterns. Further improvement of the instrument led to designing a general-purpose diffractometer able to carry out in one setting x-ray photographing by the methods of angular and energy dispersion or by either of these methods separately. A structural diagram of this diffractometer is presented. This instrument is distinguished from the standard diffractometer mainly by the fact that the system for recording x-radiation is based on a multiparameter analyzer (MA). The MA is described in detail. The suggested hardware realization of the method of simultaneous recording of angular and energy-dispersion diffraction patterns based on a highly efficient and reliable PC with extensive system and applied software, including programs for processing spectra, provides qualitatively new possibilities of making the experimenter's work more convenient and productive. 4 refs., 3 figs., 1 tab

Additional details

Publishing Information

Journal Title
Industrial Laboratory
Journal Volume
58
Journal Issue
9
Journal Page Range
p. 857-862.
ISSN
0019-8447
CODEN
INDLAP

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25011305
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Translation
Descriptors DEI
DESIGN; PARAMETRIC ANALYSIS; PHOTOGRAPHY; QUALITATIVE CHEMICAL ANALYSIS; SPECIFICATIONS; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTOMETERS
Descriptors DEC
CHEMICAL ANALYSIS; DIFFRACTOMETERS; MEASURING INSTRUMENTS

Optional Information

Notes
Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 58: No. 9, 43-46(Sep 1992).