Published May 31, 2006
| Version v1
Journal article
The contribution of 29Si ligand superhyperfine interactions to the line width of paramagnetic centers in silicon
- 1. University of Nizhny Novgorod, Gagarin Avenue 23, Nizhny Novgorod 603600 (Russian Federation)
- 2. University of Amsterdam, Amsterdam (Netherlands)
Description
The results of a numerical approach for the modeling of the contribution of ligand superhyperfine interactions to the line width of the paramagnetic negative vacancy and of positively charged iron centers in silicon are reported. The dependence which is obtained for the contribution to the line width on the concentration of magnetic nuclei has a linear character for low concentrations of nuclei with non-zero spin, and transforms to a square-root dependence at high concentrations. It is shown that the behavior depends on the distribution of spin density around the paramagnetic center. The results of the numerical approach are confirmed by a theoretical analysis using computations of resonance line moments
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2006.01.004;
- PII
- S0921-4526(06)00185-2;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 381
- Journal Issue
- 1-2
- Journal Page Range
- p. 164-167
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37073317
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; DENSITY; DISTRIBUTION; ELECTRON SPIN RESONANCE; IRON; LIGANDS; LINE WIDTHS; PARAMAGNETISM; SILICON; SILICON 29; SPIN; VACANCIES
- Descriptors DEC
- ANGULAR MOMENTUM; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; EVEN-ODD NUCLEI; ISOTOPES; LIGHT NUCLEI; MAGNETIC RESONANCE; MAGNETISM; METALS; NUCLEI; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; POINT DEFECTS; RESONANCE; SEMIMETALS; SILICON ISOTOPES; SIMULATION; STABLE ISOTOPES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.