Published April 15, 2014 | Version v1
Journal article

Defect-related electronic metastabilities in chalcopyrite compounds

  • 1. Energy and Semiconductor Research Laboratory, Department of Physics, University of Oldenburg, 26111 Oldenburg (Germany)
  • 2. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), Industriestr. 6, 70565 Stuttgart (Germany)

Description

So far, in Cu(In,Ga)Se2 solar cells the metastable behavior of the key parameters, i.e. open circuit voltage, short circuit current and fill factor, and the corresponding defect physics were typically investigated independently. In order to contribute to this issue, we systematically varied between annealed and light soaked state and investigated the influence of these processes on the solar cell parameters as well as on the defect physics. In this work, we attempt to correlate the key parameters of the solar cells and the defect physics by discussing experimental results obtained from temperature dependent current–voltage measurements (IVT) as well as from capacitance voltage (CV), admittance (AS) and deep-level transient spectroscopy (DLTS). A commonly observed defect contribution in Cu(In,Ga)Se2 solar cells is the so-called N1 signature. The activation energy of this signature was found to increase upon air-annealing in the dark which goes along with a decrease in the open circuit voltage and the effective doping density. In this paper we will discuss the correlation between annealing-induced shifting of defect energies and the variation of the key parameters.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2013.11.026

Additional details

Identifiers

DOI
10.1016/j.physb.2013.11.026;
PII
S0921-4526(13)00739-4;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
439
Journal Page Range
p. 60-63
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
5. South African conference on photonic materials
Acronym
SACPM 2013
Dates
29 Apr - 3 May 2013
Place
Kariega Game Reserve (South Africa)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.