Characterization of CuInSe2 thin films grown by photo-assisted electrodeposition
- 1. Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, ROC (China)
- 2. Institute of Materials Science and Engineering, National Sun Yat-Sen University, Kaohsiung 804, Taiwan, ROC (China)
Description
A photo-assisted one-step electrodeposition has been applied to help in forming smooth and dense CuInSe2 (CIS) films. The difference in surface morphology and crystalline quality between CIS films with and without photo-assistance has been investigated. In the photo-assisted electrodeposition process, a halogen lamp providing maximum light intensity at about 0.6 μm–1.0 μm was used as light source to be irradiated onto the surface of Mo-coated soda lime glass substrates. Electrodeposited CIS thin films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), atomic force microscopy (AFM) and Raman spectroscopy. SEM and AFM results show a smoother film with lower roughness by photo-assisted electrodeposition at lower deposition potential. From the XRD patterns, it was found that photo-assistance enhanced the crystalline quality, and the enhancement remained after annealing at 500 °C for 120 s. The analysis of Raman spectra indicated a reduction in secondary phases after applying photo-assistance. These results suggested effects of photo-assistance including activating surface diffusion and growing high-crystalline quality films with reduced defects during electrodeposition. - Highlights: ► A photo-assisted electrodeposition process is proposed. ► Dense CuInSe2 films with lower roughness are achieved by photo-assistance. ► Better crystallinity is achieved by photo-assistance. ► Secondary phases in CuInSe2 thin films are reduced by photo-assistance
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2013.01.034Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2013.01.034;
- PII
- S0040-6090(13)00153-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 535
- Journal Page Range
- p. 343-347
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46084724
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; CHALCOPYRITE; DIFFUSION; ELECTRODEPOSITION; HALOGENS; IRRADIATION; LIGHT SOURCES; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; SURFACES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; FILMS; HEAT TREATMENTS; LASER SPECTROSCOPY; LYSIS; MICROSCOPY; MINERALS; NONMETALS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATION SOURCES; SCATTERING; SOLAR EQUIPMENT; SPECTRA; SPECTROSCOPY; SULFIDE MINERALS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.