Published November 28, 2008
| Version v1
Journal article
Comparative study of n-doping and p-doping of poly(3,4-ethylenedioxythiophene) electrosynthesised on aluminium
- 1. Abo Akademi University, Process Chemistry Centre, c/o Laboratory of Analytical Chemistry, Biskopsgatan 8, FI-20500 Abo - Turku (Finland)
Description
Aluminium was used as substrate for electropolymerisation of poly(3,4-ethylenedioxythiophene), PEDOT. The p- and n-doping behaviour of the PEDOT films was studied both electrochemically by cyclic voltammetry, and spectroscopically by in situ external reflection Fourier transform infrared spectroscopy during stepwise potential cycling of the films. The polymer films were also studied by resonance Raman spectroscopy with three different excitation wavelengths (514 nm, 633 nm and 780 nm). The surface morphology of the films was studied by scanning electron microscopy. The results indicate that PEDOT, polymerised on Al, is both p- and n-dopable, making it an interesting material for organic electronics applications
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2008.06.033Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2008.06.033;
- PII
- S0040-6090(08)00673-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 517
- Journal Issue
- 2
- Journal Page Range
- p. 474-478
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40061618
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ALUMINIUM; DOPED MATERIALS; ELECTROCHEMISTRY; EXCITATION; FILMS; FOURIER TRANSFORM SPECTROMETERS; HETEROCYCLIC COMPOUNDS; INFRARED SPECTRA; MORPHOLOGY; ORGANIC SULFUR COMPOUNDS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; VOLTAMETRY
- Descriptors DEC
- CHEMISTRY; ELECTRON MICROSCOPY; ELEMENTS; ENERGY-LEVEL TRANSITIONS; LASER SPECTROSCOPY; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; ORGANIC COMPOUNDS; SPECTRA; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.