A novel technique for processing functionally graded HA coatings
- 1. Department of Mechanical and Aerospace Engineering, North Carolina State University, 3211 Broughton Hall, 2601 Stinson Dr., Campus Box 7910, Raleigh, NC 27695-7910 (United States)
- 2. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7910 (United States)
Description
Hydroxyapatite (HA) films were deposited using dual ion beam sputtering. Deposition was carried out with an in situ heat treatment at three temperature settings during deposition. X-ray diffraction of the films at the surface revealed that the deposited film is composed of hydroxyapatite crystalline and amorphous phases. Cross-sectional transmission electron microscopy analysis displayed that the films have a graded crystal structure with the crystalline layer near the substrate and the amorphous layer at the top surface. Compositional analysis was performed using SEM-EDX at the top surface as well as STEM-EDX at the cross-section of the film. The average calcium to phosphorous ratio at the surface is 1.46, obtained by SEM-EDX. The Ca/P ratios in the crystalline and amorphous layers of the film are 1.6 to 1.7, close to the ratio of 1.67 for HA
Additional details
Identifiers
- DOI
- 10.1016/j.msec.2006.05.037;
- PII
- S0928-4931(06)00156-1;
Publishing Information
- Journal Title
- Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
- Journal Volume
- 27
- Journal Issue
- 3
- Journal Page Range
- p. 523-528
- ISSN
- 0928-4931
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39030246
- Subject category
- S60: APPLIED LIFE SCIENCES;
- Descriptors DEI
- AMORPHOUS STATE; APATITES; CROSS SECTIONS; CRYSTAL STRUCTURE; FILMS; HEAT TREATMENTS; ION BEAMS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; MINERALS; PHOSPHATE MINERALS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.