Published February 1, 2021 | Version v1
Journal article

Vertical GaN Shottky barrier diode with thermally stable TiN anode

  • 1. Department of Physics, Xinxiang University, Xinxiang 453003 (China)
  • 2. Institute of Technology and Science, Tokushima University, Tokushima 770-8506 (Japan)
  • 3. School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou 510275 (China)
  • 4. State Key Laboratory of Superhard Material, Jilin University, Changchun 130012 (China)

Description

Vertical GaN Schottky barrier diodes with TiN anodes were fabricated to investigate the electrical performance. The turn-on voltage and specific on-resistance of diodes are deduced to be approximately 0.41 V and 0.98 mΩ⋅cm2, respectively. The current-voltage curves show rectifying characteristics under different temperatures from 25 °C to 200 °C, implying a good thermal stability of TiN/GaN contact. The low-frequency noise follows a 1/f behavior due to the multiple traps and/or barrier inhomogeneous at TiN/GaN interface. The trapping/de-trapping between traps and Fermi level causes the slight capacitance dispersion under reverse voltage. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/abc547

Additional details

Identifiers

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
30
Journal Issue
3
Journal Page Range
[4 p.]
ISSN
1674-1056