Published February 1, 2021
| Version v1
Journal article
Vertical GaN Shottky barrier diode with thermally stable TiN anode
- 1. Department of Physics, Xinxiang University, Xinxiang 453003 (China)
- 2. Institute of Technology and Science, Tokushima University, Tokushima 770-8506 (Japan)
- 3. School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou 510275 (China)
- 4. State Key Laboratory of Superhard Material, Jilin University, Changchun 130012 (China)
Description
Vertical GaN Schottky barrier diodes with TiN anodes were fabricated to investigate the electrical performance. The turn-on voltage and specific on-resistance of diodes are deduced to be approximately 0.41 V and 0.98 mΩ⋅cm2, respectively. The current-voltage curves show rectifying characteristics under different temperatures from 25 °C to 200 °C, implying a good thermal stability of TiN/GaN contact. The low-frequency noise follows a 1/f behavior due to the multiple traps and/or barrier inhomogeneous at TiN/GaN interface. The trapping/de-trapping between traps and Fermi level causes the slight capacitance dispersion under reverse voltage. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/abc547Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 30
- Journal Issue
- 3
- Journal Page Range
- [4 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53080592
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; FERMI LEVEL; GALLIUM NITRIDES; SCHOTTKY BARRIER DIODES; TITANIUM NITRIDES
- Descriptors DEC
- ELECTRICAL PROPERTIES; ENERGY LEVELS; GALLIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS