Published November 25, 2009 | Version v1
Journal article

Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact

  • 1. Universite Bordeaux 1-CPMOH 351, Cours de la Liberation, 33405 Talence Cedex (France)
  • 2. ELORET Corp, NASA Ames Research Center, Moffett Field, CA (United States)
  • 3. IEMN, ISEN Department, Cite Scientifique, BP 60069, F-59652 Villeneuve d'Ascq (France)

Description

Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical atomic force microscope modes. Experimental results show that the carbon nanotube contacts can be classified in two categories: the free sliding and pinned cases. The pinned contact case requires the description of the cantilever flexural vibrations with support spring-coupled cantilever boundary conditions. Our experimental results show that carbon nanotubes exhibit different contact behaviors with a surface, and in turn different mechanical responses.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/20/47/475701

Additional details

Identifiers

DOI
10.1088/0957-4484/20/47/475701;
PII
S0957-4484(09)19059-1;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
20
Journal Issue
47
Journal Page Range
[8 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42080595
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; CARBON; NANOTUBES; PROBES; SPECTRA; SURFACES
Descriptors DEC
ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS