Published December 18, 2002 | Version v1
Journal article

A fast VME data acquisition system for spill analysis and beam loss measurement

  • 1. Gesellschaft fuer Schwerionenforschung (GSI), Planckstrasse 1, D-64291 Darmstadt (Germany)
  • 2. ITEP Moscow (Russian Federation)

Description

Particle counters perform the control of beam loss and slowly extracted currents at the heavy ion synchrotron (SIS) at GSI. For these devices a new data acquisition system has been developed with the main intention to combine the operating purposes beam loss measurement, spill analysis, spill structure measurement and matrix switching functionality in one single assembly. To provide a reasonable digital selection of counters at significant locations a modular VME setup based on the GSI data acquisition software MBS (Multi Branch System) was chosen. An overview of the design regarding the digital electronics and the infrastructure is given. Of main interest in addition to the high performance of the used hardware is the development of a user-friendly software interface for hardware controls, data evaluation and presentation to the operator

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
648
Journal Issue
1
Journal Page Range
p. 329-336
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
10. beam instrumentation workshop
Dates
6-9 May 2002
Place
Upton, NY (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36064725
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM CURRENTS; BEAM OPTICS; COMPUTER CODES; CONTROL; DATA ACQUISITION; DATA ACQUISITION SYSTEMS; DESIGN; DIAGNOSTIC TECHNIQUES; HEAVY IONS; INTERFACES; ION BEAMS; PARTICLE BEAMS; PERFORMANCE; SYNCHROTRONS
Descriptors DEC
ACCELERATORS; BEAMS; CHARGED PARTICLES; CURRENTS; CYCLIC ACCELERATORS; IONS

Optional Information

Notes
(c) 2002 American Institute of Physics