Diffractive elements performance in chromatic confocal microscopy
- 1. Grupo de Optica y EspectroscopIa, Centro de Ciencia Basica, Universidad Pontificia Bolivariana. Medellin (Colombia)
- 2. Laboratorio de Optica y Tratamiento de Senales, Instituto de Fisica, Universidad Industrial de Santander, Bucaramanga (Colombia)
- 3. Laboratoire d'Optique P. M. Duffieux, UMR-6603 CNR/Universite de Franche-Comte. 16 route de Gray, 25030 Besancon Cedex (France)
Description
The Confocal Laser Scanning Microscopy (CLSM) has been widely used in the semiconductor industry and biomedicine because of its depth discrimination capability. Subsequent to this technique has been developed in recent years Chromatic Confocal Microscopy. This method retains the same principle of confocal and offers the added advantage of removing the axial movement of the moving system. This advantage is usually accomplished with an optical element that generates a longitudinal chromatic aberration and a coding system that relates the axial position of each point of the sample with the wavelength that is focused on each. The present paper shows the performance of compact chromatic confocal microscope when some different diffractive elements are used for generation of longitudinal chromatic aberration. Diffractive elements, according to the process and manufacturing parameters, may have different diffraction efficiency and focus a specific wavelength in a specific focal position. The performance assessment is carried out with various light sources which exhibit an incoherent behaviour and a broad spectral width.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/274/1/012069Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 274
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
Conference
- Title
- 17. annual Ibero-American conference on optics (RIAO); 10. Latin American meeting on optics, lasers and applications (OPTILAS)
- Dates
- 20-24 Sep 2010
- Place
- Lima (Peru)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43047105
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGES; CHROMATIC ABERRATIONS; DIFFRACTION; EFFICIENCY; LASER RADIATION; LIGHT SOURCES; MANUFACTURING; MICROSCOPES; MICROSCOPY; PERFORMANCE; SCANNING LIGHT MICROSCOPY; SEMICONDUCTOR MATERIALS; WAVELENGTHS
- Descriptors DEC
- COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; MATERIALS; MICROSCOPY; OPTICAL MICROSCOPY; RADIATION SOURCES; RADIATIONS; SCATTERING