A New Cryogenic Sample Manipulator For SRC's Scienta 2002 System

We discuss the first bench tests of a sample manipulator which was recently designed at SRC for the Scienta 2002 User system. The manipulator concept utilizes the 10 deg. angular window of the Scienta in the horizontal plane (angle dispersion) by rotating the sample normal around the vertical axis while angular scans along the vertical axis (energy dispersion) are continuous within ±30 deg. relative to the electron lens by rotating the sample around the horizontal axis. With this concept it is possible to precisely map the entire two-dimensional k-space of a crystal by means of stitching together 10 deg. wide stripes centered +15 deg. to -50 deg. relative to the sample normal. Three degrees of translational freedom allow positioning the sample surface at the focal point of the analyzer. Two degrees of rotational freedom are available at this position for manipulating the sample. Samples are mounted to a standard holder and transferred to the manipulator via a load-lock system attached to a prep chamber. The manipulator is configured with a cryogenic cold head, an electrical heater, and a temperature sensor permitting continuous closed-loop operation for 20-380 K