Shape transformation of Sn nanocrystals induced by swift heavy-ion irradiation and the necessity of a molten ion track
Creators
- 1. Research School of Physics and Engineering, Australian National University, Canberra, ACT 0200 (Australia)
- 2. Instituto de Fisica, Universidade Federal do Rio Grande do Sul, Av. Bento Goncalves 9500, Ciaxa Postal 1501, CEP 91501-970, Porto Alegre, Rs (Brazil)
Description
We report on the spherical to rodlike shape transformation of Sn nanocrystals (NCs) embedded in amorphous SiO2 following irradiation with 185 MeV Au ions. Consistent with previous reports for other metals, transmission electron microscopy demonstrates that under irradiation, Sn NCs larger than a critical size (11 nm) elongate parallel to the incident ion direction, while smaller particles remain spherical. Irradiation-induced NC dissolution is significant, as evident from the formation of smaller NCs in place of their original larger counterparts. Using formation conditions that yield Sn NCs at the amorphous-SiO2/crystalline-Si interface, we show that the irradiation-induced shape change occurs only within the SiO2 layer, in the direction opposite to that of the incident ions. We suggest this demonstrates the necessity of a molten ion track and provides further evidence for an elongation process involving NC melting and flow.
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 82
- Journal Issue
- 11
- Journal Page Range
- p. 113410-113410.4
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42015814
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRITICAL SIZE; DISSOLUTION; ELONGATION; GOLD IONS; HEAVY IONS; INTERFACES; IRRADIATION; LAYERS; MELTING; METALS; MEV RANGE 100-1000; NANOSTRUCTURES; PARTICLE TRACKS; PHYSICAL RADIATION EFFECTS; SILICON OXIDES; SPHERICAL CONFIGURATION; TIN; TRANSFORMATIONS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CONFIGURATION; DEFORMATION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; IONS; METALS; MEV RANGE; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; RADIATION EFFECTS; SILICON COMPOUNDS; SIZE
Optional Information
- Notes
- (c) 2010 The American Physical Society