Published July 31, 2013 | Version v1
Journal article

Study of back reflectors for thin film silicon solar cells

  • 1. Baoding Tianwei Solarfilms Co., Ltd., Baoding 071051 (China)
  • 2. Department of Chemistry and Material Science, Hunan Institute of Humanities, Science and Technology, Loudi 417000 (China)

Description

In this study, the reflection properties of transparent conductive oxide (TCO) films i.e. aluminum doped zinc oxide (ZnO:Al) and boron doped zinc oxide (ZnO:B) films plus aluminum (Al) films or white polyvinyl butyral (PVB) foils, which are usually used as the combined back reflectors of thin film silicon solar cells, are investigated. Sputtered ZnO:Al films were etched in diluted hydrochloric acid (1%) to achieve rough surface structures while textured ZnO:B films were directly prepared by a low pressure chemical vapor deposition technique. It is found that the rough TCO/Al reflectors show a low total reflection, which is mainly due to the parasitic absorption by the surface plasmons at the rough TCO/Al interfaces as well as the absorption in the TCO films. Differently, the rough TCO/white PVB foil reflectors display a slightly high light reflection regardless of the influence of the rough interface without the excitation of surface plasmons. Thus, the TCO/white PVB foil back reflectors could be a good candidate with respect to light utilization when they are applied in thin film silicon solar cells. - Highlights: • White polyvinyl butyral and transparent conductive oxide materials are used. • The reflection properties of TCO/Al and TCO/white PVB foil reflectors are studied. • The ZnO:Al and ZnO:B films are used as two types of TCO materials. • TCO/white PVB foil reflector shows a high reflection compared to TCO/Al reflector

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.05.019

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.05.019;
PII
S0040-6090(13)00834-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
539
Journal Page Range
p. 284-289
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.