Published April 30, 2005
| Version v1
Journal article
Antiferromagnetism in CeCu2(Si1-xGex)2: nature of the A phase
Creators
- 1. Max-Planck-Institut fuer Chem. Physik fester Stoffe, D-01187 Dresden (Germany)
- 2. Institut fuer Festkoerperphysik, TU Dresden, D-01062 Dresden (Germany)
- 3. Hahn-Meitner-Institut, D-14109 Berlin (Germany)
Description
We report on extensive neutron diffraction on single crystalline CeCu2(Si1-xGex)2 to determine the antiferromagnetic order in the regime with low Ge content, initially called A phase due to the unknown origin of the magnetic order. Starting from the x=0.45 alloy we followed the magnetic order to lower Ge concentrations and to pure CeCu2Si2. For all Ge concentrations x=<1 an incommensurate magnetic order with a propagation vector close to τ=(0.250.250.5) is observed. The magnetic order is determined by the nesting properties of the Fermi surface
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.01.059;
- PII
- S0921-4526(05)00063-3;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 359-361
- Journal Page Range
- p. 349-356
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- International conference on strongly correlated electron systems
- Acronym
- SCES '04
- Dates
- 26-30 Jul 2004
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37065631
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETISM; CERIUM; CONCENTRATION RATIO; COPPER; FERMI LEVEL; FERMIONS; GERMANIUM; INTERMETALLIC COMPOUNDS; MONOCRYSTALS; NEUTRON DIFFRACTION; SILICON; VECTORS
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIMENSIONLESS NUMBERS; ELEMENTS; ENERGY LEVELS; MAGNETISM; METALS; RARE EARTHS; SCATTERING; SEMIMETALS; TENSORS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.