Published 1991
| Version v1
Report
Solid-state and materials research: solid state interaction in thin film structures. Transmission electron diffraction (TED) characterization of silicides
Creators
- 1. National Accelerator Centre, Faure (South Africa)
- 2. Stellenbosch Univ. (South Africa). Dept. of Physics
Description
Short communication
Additional details
Publishing Information
- ISBN
- 1 8748 7703 3
- Imprint Title
- NAC annual report March 1991
- Imprint Pagination
- 129 p.
- Journal Page Range
- p. 67-68.
- Report number
- NAC-AR--91-01
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 24058188
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Progress Report, No Abstract, Non-conventional Literature
- Descriptors DEI
- COMPUTERS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; PHASE STUDIES; PROGRESS REPORT; SILICIDES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DOCUMENT TYPES; FILMS; SCATTERING; SILICON COMPOUNDS