Modeling of inelastic collisions in a multifluid plasma: Excitation and deexcitation
Creators
- 1. Department of Mathematics, University of California, Los Angeles, California 90095 (United States)
- 2. Air Force Research Laboratory, Edwards AFB, California 93524 (United States)
Description
We describe here a model for inelastic collisions for electronic excitation and deexcitation processes in a general, multifluid plasma. The model is derived from kinetic theory, and applicable to any mixture and mass ratio. The principle of detailed balance is strictly enforced, and the model is consistent with all asymptotic limits. The results are verified with direct Monte Carlo calculations, and various numerical tests are conducted for the case of an electron-hydrogen two-fluid system, using a generic, semi-classical model of collision cross sections. We find that in some cases, the contribution of inelastic collisions to the momentum and thermal resistance coefficients is not negligible, in contrast to the assumptions of current multifluid models. This fundamental model is also applied to ionization and recombination processes, the studies on which are currently underway
Additional details
Identifiers
- DOI
- 10.1063/1.4931170;
- arXiv
- arXiv:1509.00927v1;
Publishing Information
- Journal Title
- Physics of Plasmas
- Journal Volume
- 22
- Journal Issue
- 9
- Journal Page Range
- p. 093512-093512.17
- ISSN
- 1070-664X
- CODEN
- PHPAEN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47063920
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ASYMPTOTIC SOLUTIONS; COLLISIONS; COMPUTERIZED SIMULATION; CROSS SECTIONS; CURRENTS; DE-EXCITATION; ELECTRONS; EXCITATION; HYDROGEN; MONTE CARLO METHOD; PLASMA; RECOMBINATION
- Descriptors DEC
- CALCULATION METHODS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FERMIONS; LEPTONS; MATHEMATICAL SOLUTIONS; NONMETALS; SIMULATION
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC