Published December 2019 | Version v1
Journal article

180° domain related to structurally complex crystals in Al60Cr20Fe10Si10

  • 1. State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing, 100083 (China)
  • 2. Laboratory for Advanced Materials & Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190 (China)
  • 3. Crystal Structure Laboratory and National Laboratory of Mineral Materials, China University of Geosciences (Beijing), Beijing, 100083 (China)

Description

Highlights: • We found a novel 180° domain caused by inversed structural blocks. • Atomically resolved structures of the 180° domain are revealed. • Projected structural models of the domain boundaries are proposed. • Formation mechanisms of the 180° domain are discussed. -- Abstract: In conventional crystals, the 180° domain is generally reflected by the inversed arrangement of the orientation of unit cells in nearby domains. Herein, we report a special 180° domain related to the inverse arrangement of structural blocks in structurally complex phases in an Al60Cr20Fe10Si10 alloy. The structural features were investigated in detail by high-angle annular dark-field scanning transmission electron microscopy with atomic resolution. Furthermore, the corresponding projected structural models of the domain boundaries were proposed. Finally, the structure and the formation mechanism of the 180° domain are compared and discussed with an antiphase domain in the same alloy system.

Additional details

Identifiers

DOI
10.1016/j.matchar.2019.109947;
PII
S1044580319321515;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
158
Journal Page Range
vp.
ISSN
1044-5803
CODEN
MACHEX

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55031143
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOY SYSTEMS; ALLOYS; CRYSTALS; DEFECTS; DOMAIN STRUCTURE; RESOLUTION; STRUCTURAL MODELS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2019 Elsevier Inc. All rights reserved.