Published December 1, 2018
| Version v1
Journal article
Technique for measuring basic characteristics of electron-optical cameras
Creators
- 1. A.M. Prokhorov General Physics Institute, Russian Academy of Sciences, ul. Vavilova 38, 119991 Moscow (Russian Federation)
Description
A procedure is described for determining the basic parameters of linear-sweep electron-optical cameras. The techniques are considered for measuring the limiting temporal resolution and dynamic range of the PS-1/S1 camera using a femtosecond laser and sinusoidal-modulated laser radiation. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1070/QEL16800Additional details
Identifiers
- DOI
- 10.1070/QEL16800;
Publishing Information
- Journal Title
- Quantum Electronics (Woodbury, N.Y.)
- Journal Volume
- 48
- Journal Issue
- 11
- Journal Page Range
- p. 1067-1072
- ISSN
- 1063-7818
- CODEN
- QUELEZ
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52045183
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CAMERAS; ELECTRONS; LASER RADIATION; LASERS; OPTICAL SYSTEMS; RESOLUTION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; RADIATIONS