Published February 2006 | Version v1
Journal article

Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source

  • 1. Lawrence Berkeley National Laboratory, Chemical Sciences Division, Mail Stop 6R2100, One Cyclotron Road, Berkeley, CA 94720 (United States)
  • 2. FYSIKUM, Stockholm University, Albanova University Center, S-10691 Stockholm (Sweden)
  • 3. Stanford Synchrotron Radiation Laboratory, Menlo Park, CA 94025 (United States)
  • 4. Brockhouse Institute for Materials Research, McMaster University, Hamilton, Ont., L8S 4M1 (Canada)

Description

We present examples of the application of synchrotron-based spectroscopies and microscopies to environmentally relevant samples. The experiments were performed at the molecular environmental science beamline (11.0.2) at the Advanced Light Source, Lawrence Berkeley National Laboratory. Examples range from the study of water monolayers on Pt(1 1 1) single crystal surfaces using X-ray emission spectroscopy and the examination of alkali halide solution/water vapor interfaces using ambient pressure photoemission spectroscopy, to the investigation of actinides, river water biofilms, Al-containing colloids and mineral-bacteria suspensions using scanning transmission X-ray spectromicroscopy. The results of our experiments show that spectroscopy and microscopy in the soft X-ray energy range are excellent tools for the investigation of environmentally relevant samples under realistic conditions, i.e., with water or water vapor present at ambient temperature

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.07.005;
PII
S0368-2048(05)00457-3;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
150
Journal Issue
2-3
Journal Page Range
p. 86-104
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.